Auger electron

基本解释

Microstructures of thin films are characterized by X-ray Diffraction (XRD) and auger Electron spectroscopy (AES).
通过X射线衍射（XRD）和俄歇电子能谱（AES）分析研究了薄膜的微结构；
The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry (AES).
利用X射线衍射（XRD）和俄歇电子衍射（AES）观察了表面膜的化学成分及结构。
The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.
结合俄歇电子能谱和红外光谱分析膜的微观结构，对薄膜的电子注入特性进行了理论分析与讨论。